- Domeniu: Semiconductors
- Number of terms: 2987
- Number of blossaries: 0
- Company Profile:
National Semiconductor Corporation designs, develops, manufactures, and markets analog and mixed-signal integrated circuits and sub-systems.
A lot of wafers metallized at the same time. Since the number of wafers accommodated by an evaporation (i.e., metallization) chamber is frequently less than the number of wafers accommodated by a diffusion chamber, it is possible to have several metallization runs which came from the same wafer run.
Industry:Semiconductors
A very small crack within the metal or other material of a semiconductor device, typically not detectable using optical magnification. In the metallization area, microcracks most typically occur at contact steps. Microcracks can lead to discontinuities in the circuitry.
Industry:Semiconductors
A unit of length. 106µ= 1 m (meter). [Note: µ as a symbol of length should not be confused with µ used as a prefix to indicate microunits, such as µA (microamps) or µV microvolts). A micron is one micrometer.]
Industry:Semiconductors
The relocation or movement of physical materials into or across other adjacent materials. (See electromigration.)
Industry:Semiconductors
The nonpredominant mobile charge carrier in a semiconductor (such as electrons in a P-region, where the majority carrier would be holes).
Industry:Semiconductors
Subjection of sample devices to a cycle of high humidity and temperature stresses to determine the ability of these devices to survive under severe environmental conditions. This is normally performed on a sample basis with 10 cycles of 24-hour duration.
Industry:Semiconductors
A device which is completely encapsulated in epoxy or an alternate molding compound, that is, with no internal cavity.
Industry:Semiconductors
A device whose circuitry is completed contained on a single die or chip.
Industry:Semiconductors
MSI devices are generally accepted to be those that contain 12 or more gate equivalents, but less than 100. (See LSI.)
Industry:Semiconductors
The average number of operating hours after a device has failed that would pass before the next device failure would be expected to occur.
Industry:Semiconductors
